{"id":2509,"date":"2025-06-19T19:36:32","date_gmt":"2025-06-19T11:36:32","guid":{"rendered":"https:\/\/www.ledphotometer.com\/blog\/bulk-current-injection-bci-test-system\/"},"modified":"2025-07-01T17:55:17","modified_gmt":"2025-07-01T09:55:17","slug":"toplu-akim-enjeksiyonu-bci-test-sistemi","status":"publish","type":"post","link":"https:\/\/www.ledtestsystem.com\/tr\/urunler\/toplu-akim-enjeksiyonu-bci-test-sistemi\/","title":{"rendered":"Toplu Ak\u0131m Enjeksiyon Test Sistemi (BCI), ISO11452-4 standard\u0131na tamamen uygundur."},"content":{"rendered":"

LSBCI-40 Toplu Ak\u0131m Enjeksiyon Test Sistemi (BCI) standartlar\u0131 tam olarak kar\u015f\u0131lamaktad\u0131r. ISO 11452-4: 2011<\/a>, GB\/T 32960.2-2016,<\/a>\u00a0GB\/T 17619 ve GB\/T 33014.4 standartlar\u0131na uygundur. 100 kHz'lik ultra d\u00fc\u015f\u00fck ba\u015flang\u0131\u00e7 frekans\u0131, k\u00fcresel otomobil \u015firketlerinin test gereksinimlerini kar\u015f\u0131lamak i\u00e7in yeterlidir. Dahili 3 kanall\u0131 g\u00fc\u00e7 \u00f6l\u00e7ere sahiptir ve ileri ve geri y\u00f6ndeki g\u00fcc\u00fc ger\u00e7ek zamanl\u0131 olarak izlemek i\u00e7in y\u00f6nl\u00fc kupl\u00f6r kullanabilir.<\/p>\n

Standart:<\/strong>
\nISO 11452-4\u00a0<\/a> \u201cKarayolu ta\u015f\u0131tlar\u0131 \u2014 Dar bantl\u0131 yay\u0131lan elektromanyetik enerjiden kaynaklanan elektriksel bozulmalar i\u00e7in bile\u015fen test y\u00f6ntemleri - B\u00f6l\u00fcm 4: Kablo demeti uyarma y\u00f6ntemleri\u201d
\nGB\/T 32960.2-2016<\/a> \u201cElektrikli ara\u00e7lar i\u00e7in uzaktan servis ve y\u00f6netim sisteminin teknik \u00f6zellikleri \u2013 B\u00f6l\u00fcm 2: Ara\u00e7 i\u00e7i terminal\u201d<\/p>\n

Sistem yap\u0131land\u0131rmas\u0131 ve teknik parametreler:<\/strong><\/p>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
1. Test sunucusu<\/strong><\/td>\n<\/tr>\n
Ak\u0131m\u0131 Test Et<\/td>\nA\u00e7\u0131k devre testi (yerine koyma testi) \u2264300mA;
\nKapal\u0131 devre testi \u2264200mA (tam otomatik kalibrasyon, tam otomatik test ve test s\u0131ras\u0131nda \u00e7\u0131k\u0131\u015f g\u00fcc\u00fc izleme)<\/td>\n<\/tr>\n
\u00c7\u0131k\u0131\u015f Empedans\u0131<\/td>\n50\u03a9<\/td>\n<\/tr>\n
Gerilim Durgun Dalga Oran\u0131<\/td>\n\u22641.2<\/td>\n<\/tr>\n
\u00c7ince ve \u0130ngilizce yaz\u0131l\u0131m<\/td>\nWin7,Win8 veWin10,Win11'i destekleyin<\/td>\n<\/tr>\n
2. Sinyal Kayna\u011f\u0131 (dahili)<\/strong><\/td>\n<\/tr>\n
Frekans<\/td>\n9kHz~3GHz<\/td>\n<\/tr>\n
\u00c7\u0131k\u0131\u015f Seviyesi<\/td>\n-60~10dBm<\/td>\n<\/tr>\n
Mod\u00fcle edilmemi\u015f sinyal<\/td>\nS\u00fcrekli Dalga<\/td>\n<\/tr>\n
Mod\u00fclasyon Modu<\/td>\nGenlik mod\u00fclasyon frekans\u0131: 0,1 Hz~500 kHz; Mod\u00fclasyon Derinli\u011fi: 0~100%<\/td>\n<\/tr>\n
Darbe mod\u00fclasyon frekans\u0131: 0,1 Hz~20 kHz; G\u00f6rev d\u00f6ng\u00fcs\u00fc: 1~100%<\/td>\n<\/tr>\n
3. G\u00fc\u00e7 Amplifikat\u00f6r\u00fc (dahili)<\/strong><\/td>\n<\/tr>\n
\u00c7\u0131k\u0131\u015f Frekans\u0131<\/td>\n100kHz~400MHz (1GHz'e kadar \u00f6l\u00e7eklenebilir)<\/td>\n<\/tr>\n
Maksimum \u00c7\u0131k\u0131\u015f G\u00fcc\u00fc<\/td>\n125W (Do\u011frusal G\u00fc\u00e7)<\/td>\n<\/tr>\n
Harmonik<\/td>\n<15dBc<\/td>\n<\/tr>\n
4. G\u00fc\u00e7 \u00d6l\u00e7er (dahili)<\/strong><\/td>\n<\/tr>\n
Giri\u015f Frekans\u0131<\/td>\n9kHz~3GHz<\/td>\n<\/tr>\n
Giri\u015f G\u00fcc\u00fc<\/td>\n-40dBm~+30dBm<\/td>\n<\/tr>\n
5. Y\u00f6nl\u00fc kupl\u00f6r (dahili): kuplaj derecesi 40dB<\/strong><\/td>\n<\/tr>\n
6. F-120-6A Ak\u0131m Enjeksiyon Probu: Maksimum Giri\u015f G\u00fcc\u00fc 1000W<\/strong><\/td>\n<\/tr>\n
7. F-52B Ak\u0131m \u0130zleme Probu: Maksimum Giri\u015f G\u00fcc\u00fc 1000W<\/strong><\/td>\n<\/tr>\n
8. FCC-BCICF-1 Toplu Ak\u0131m Enjeksiyon Probu Ba\u011flant\u0131 Elemanlar\u0131: ak\u0131m enjeksiyon problar\u0131 i\u00e7in bir ba\u011flant\u0131 eleman\u0131<\/strong><\/td>\n<\/tr>\n
9. Yapay g\u00fc\u00e7 \u015febekesi<\/strong><\/td>\n<\/tr>\n
Standartlara uyun<\/td>\nCISPR 16-1-2\uff0cCISPR 25\uff0cISO 7637-2\uff0cISO 11452-4\uff0cMIL-STD-461F\uff0cECE R10<\/td>\n<\/tr>\n
Frekans Aral\u0131\u011f\u0131\/Empedans<\/td>\n0.1~150 MHz \/ (5 \u00b5H + 1 Ohm) || 50 Ohm (+\/- 10 %)<\/td>\n<\/tr>\n
Maksimum S\u00fcrekli Ak\u0131m\/Maksimum K\u0131sa S\u00fcreli Ak\u0131m<\/td>\n200A\/250A<\/td>\n<\/tr>\n
Maksimum Gerilim<\/td>\nDC 1000V, AC 50\/60Hz 400Vrms, AC 400Hz 300Vrms'dir.<\/td>\n<\/tr>\n
10. Test Tablosu<\/strong><\/td>\n<\/tr>\n
BCI Test Tablosu<\/td>\n2*1*0.9m<\/td>\n<\/tr>\n
BCI Topraklama<\/td>\nBa\u011flant\u0131 plakas\u0131 kenar \u015feritleri 300 mm aral\u0131klarla topraklanm\u0131\u015ft\u0131r ve her bir topraklama \u015feridinin en boy oran\u0131 7:1'dir. Malzeme: pirin\u00e7<\/td>\n<\/tr>\n
Referans Zemin D\u00fczlemi<\/td>\n2*1*2 mm, Malzeme: Pirin\u00e7<\/td>\n<\/tr>\n
11. Elektromanyetik koruma kabini:<\/strong> SDR-4000B'nin i\u00e7 \u00f6l\u00e7\u00fcleri 4000*1200*1800 mm'dir (ek \u00fccret kar\u015f\u0131l\u0131\u011f\u0131nda iste\u011fe ba\u011fl\u0131d\u0131r, \u00f6l\u00e7\u00fcler m\u00fc\u015fteri gereksinimlerine g\u00f6re de tasarlanabilir).<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

B\u00f6l\u00fcm 1: Test ad\u0131mlar\u0131:<\/strong>
\nA. Testten \u00f6nce, ak\u0131m enjeksiyon probu taraf\u0131ndan \u00fcretilen bozucu ak\u0131m\u0131n kalibrasyon d\u00fczene\u011findeki gereksinimleri kar\u015f\u0131lad\u0131\u011f\u0131n\u0131 do\u011frulay\u0131n ve ard\u0131ndan ak\u0131m probunu test edilecek kablo demetinin belirtilen konumuna sabitleyin.
\nB. Kalibrasyonla elde edilen ileri g\u00fc\u00e7 esas al\u0131narak kablo demetine giri\u015fim uygulan\u0131r. Test s\u0131ras\u0131nda ak\u0131m \u015fiddeti izlenmez ve ileri g\u00fc\u00e7 art\u0131k ayarlanmaz.
\nC. Kablo demetinin uzunlu\u011fu ve ak\u0131m enjeksiyon probu ile test edilecek kablo demeti aras\u0131ndaki g\u00f6receli mesafe, test edilecek kablo demeti \u00fczerindeki bozucu elektromanyetik alan\u0131n birle\u015fme derecesini etkileyecektir.<\/p>\n

B\u00f6l\u00fcm 2: Test sonucunun belirlenmesi:<\/strong> A\u00e7\u0131k d\u00f6ng\u00fc y\u00f6ntemi esas olarak 5 seviyeye ayr\u0131l\u0131r ve her seviye farkl\u0131 bir test sonucunu temsil eder.
\nA. Test edilen cihaz\u0131n i\u015flevi veya performans\u0131 herhangi bir anormallik olmaks\u0131z\u0131n normaldir.
\nB. T\u00fcm i\u015flevler veya performanslar giri\u015fim durumundad\u0131r, bir veya daha fazla i\u015flev\/performans belirtilen toleranstan sapar, ancak giri\u015fim giderildikten sonra t\u00fcm i\u015flevler veya performanslar belirtilen tolerans s\u0131n\u0131r\u0131na geri d\u00f6ner ve saklanan verilerde herhangi bir anormallik olmamal\u0131d\u0131r.
\nC. Bir veya daha fazla i\u015flev\/performans kaybolur, ancak m\u00fcdahale uyguland\u0131ktan sonra EUT otomatik olarak normal moda geri d\u00f6ner.
\nD. Bir veya daha fazla i\u015flev\/performans kaybolur, ancak m\u00fcdahale uyguland\u0131ktan sonra insan m\u00fcdahalesiyle normal duruma geri d\u00f6nd\u00fcr\u00fcl\u00fcr.
\nE. Bir veya daha fazla i\u015flev\/performans kaybolur, ancak m\u00fcdahale uyguland\u0131ktan sonra normal moda geri d\u00f6nd\u00fcr\u00fclemezler.<\/p>\n

B\u00f6l\u00fcm 3: Test sistemi d\u00fczeni (ISO 11452-4 \u015eekil 2, \u015eekil 1 ve \u015eekil 3'e bak\u0131n\u0131z):<\/strong>
\n1. Referans topraklama d\u00fczlemi: Referans topraklama d\u00fczlemi, tercihen pirin\u00e7 olmak \u00fczere, kal\u0131nl\u0131\u011f\u0131 0,5 mm'den fazla olan metal bir plaka kullan\u0131r. Test tezgah\u0131n\u0131n ve referans topraklama d\u00fczleminin uzunlu\u011fu ve geni\u015fli\u011fi en az 1700\u00d71000 mm'dir; topraklama malzemesinin empedans\u0131 2,5 miliohm'dan fazla olmamal\u0131 ve aral\u0131k 300 mm'den fazla olmamal\u0131d\u0131r;
\n2. Yapay g\u00fc\u00e7 \u015febekesi: Uzak topraklama i\u00e7in 2 yapay g\u00fc\u00e7 \u015febekesi gerekirken, yak\u0131n u\u00e7 topraklama i\u00e7in yaln\u0131zca 1 yapay g\u00fc\u00e7 \u015febekesi (pozitif kutba ba\u011fl\u0131) yeterlidir;
\n3. Test Edilecek Cihaz\u0131n Yerle\u015ftirilmesi: Test edilecek \u00fcr\u00fcn, d\u00fc\u015f\u00fck dielektrik sabiti (1,4'ten b\u00fcy\u00fck olmayan) ve 50 (\u00b15) mm kal\u0131nl\u0131\u011f\u0131nda yal\u0131t\u0131m malzemesi \u00fczerine yerle\u015ftirilmelidir. Test edilecek cihaz\u0131n ve sim\u00fcle edilmi\u015f y\u00fck kablo demetinin toplam uzunlu\u011fu 1000 (\u00b1100) mm olmal\u0131 ve test kablo demeti, dielektrik sabiti (1,4'ten b\u00fcy\u00fck olmayan) ve 50 (\u00b15) mm kal\u0131nl\u0131\u011f\u0131nda yal\u0131t\u0131m malzemesi \u00fczerine yerle\u015ftirilmelidir.
\n4. Y\u00fcksek ak\u0131m enjeksiyon probu: Enjeksiyon probu ile test edilen cihaz (EUT) aras\u0131ndaki d mesafesi a\u015fa\u011f\u0131daki gibidir:
\nd=(150\u00b110)mm
\nd=(450\u00b110)mm
\nd=(750\u00b110)mm<\/p>\n

\n

\"\"<\/p>\n

ISO 11452-4:2020 \u015eekil 2<\/span><\/p>\n<\/div>\n

B\u00f6l\u00fcm 4: Test Raporu \u00d6rne\u011fi:<\/strong><\/p>\n

\n

\"LSBCI<\/p>\n

LSBCI-40 Verileri<\/span><\/p>\n<\/div>\n

\n

\"LSBCI<\/p>\n

LSBCI-40 A\u00e7\u0131k D\u00f6ng\u00fc Testi<\/span><\/p>\n<\/div>\n

\n

\"LSBCI<\/p>\n

LSBCI-40 Kapal\u0131 Devre Testi<\/span><\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"

LSBCI-40 Bulk Current Injection Test System\uff08BCI\uff09fully meet standard ISO 11452-4: 2011, GB\/T 32960.2-2016,\u00a0GB\/T 17619 and GB\/T 33014.4. The ultra-low starting frequency of 100KHz is sufficient to meet the testing requirements of global automobile companies. It has a built-in 3-channel power meter and can use a directional coupler to monitor forward and reverse power in real […]<\/p>\n","protected":false},"author":1,"featured_media":3497,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[6],"tags":[262],"class_list":["post-2509","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-products","tag-lsbci-40"],"_links":{"self":[{"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/posts\/2509","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/comments?post=2509"}],"version-history":[{"count":0,"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/posts\/2509\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/media\/3497"}],"wp:attachment":[{"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/media?parent=2509"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/categories?post=2509"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ledtestsystem.com\/tr\/wp-json\/wp\/v2\/tags?post=2509"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}